Chip Warpage Reduction via Raised Free Bending Geometries

Description:

Technology # 18-05

 

 

A method for Chip Warpage Reduction

 

A key challenge in microelectronic assembly arises when chip warpage, resulting from thermal expansion mismatch in layered materials, drives incompatibility in assembly, and can result in interfacial stresses when experiencing temperature swings native to device operation. Currently linear copper structures are used to deliver current and signals to and from the active elements in the device. The layout and direction of these are directly related to the warpage that is demonstrated and often have to be balanced in the design in attempt to homogenize the warpage. 

 

Application(s):

 

Cell phones, processors, micro-controllers, computers, power electronics, MEMS devices, sensors and micro-antennae.

 

Advantage(s):

 

50.78% reduction in warpage, improved yield in flip-chip assembly, reduced stresses for improved component reliability

 

Technology: 

 

A new methodology exists to increase trace freedom, relieving pressure due to thermal expansion. The results of this method have demonstrated 50.78% reduction in warpage, leading to improved yield in flip-chip assembly, and reduced stresses for improved content reliability. Additionally, the reduction in warpage is expected to impact interfacial stresses in such a way that extended lifetimes are made possible through reduction in thermo-mechanical fatigue.

 

___________________________________________ 

This invention/technology is available for licensing.

For interested parties seeking further information, feel free to contact:

Mark Allen Lanoue

Technology Manager / Tech Ventures

University of Arkansas

(479) 575-7243

malanoue@uark.edu

 

Patent Information:
App Type Country Serial No. Patent No. File Date Issued Date Expire Date
Provisional United States 62/631,337 2/15/2018    
For Information, Contact:
Mark Lanoue
Technology Manager
University of Arkansas
479-575-7243
malanoue@uark.edu
Inventors:
David Huitink
John Harris
Keywords:
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